%0 Journal Article %A Blanton, Shawn %A Goldstein, Seth C. %A Schmit, Herman %D 2005 %T Tunable Fault Tolerance via Test and Reconfiguration %U https://kilthub.cmu.edu/articles/journal_contribution/Tunable_Fault_Tolerance_via_Test_and_Reconfiguration/6611120 %R 10.1184/R1/6611120.v1 %2 https://kilthub.cmu.edu/ndownloader/files/12103301 %K computer sciences %X The advent of reconfigurable hardware as a computing medium creates a multi-dimensional design space where trade-offs between power, speed, cost, and reliability are now possible. Dynamic reconfiguration allows these trade-offs to be made on-line to adapt to various environmental changes. Furthermore, the cost of designing reliable circuits is greatly reduced since varying levels of reliability can be added to any circuit, even if it was not originally designed to run reliably, either at the time of application start-up or during application execution. %I Carnegie Mellon University