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Scalable Defect Tolerance for Molecular Electronics
journal contribution
posted on 2001-01-01, 00:00 authored by Mahim Mishra, Seth C. GoldsteinChemically assembled electronic nanotechnology (CAEN)
is a promising alternative to CMOS-based computing.
However, CAEN-based circuits are expected to have huge
defect densities. To solve this problem CAEN can be used
to build reconfigurable fabrics which, assuming the defects
can be found, are inherently defect tolerant. In this paper,
we propose a scalable testing methodology for finding defects
in reconfigurable devices.