Scalable Defect Tolerance for Molecular Electronics
journal contributionposted on 01.01.2001 by Mahim Mishra, Seth C. Goldstein
Any type of content formally published in an academic journal, usually following a peer-review process.
Chemically assembled electronic nanotechnology (CAEN) is a promising alternative to CMOS-based computing. However, CAEN-based circuits are expected to have huge defect densities. To solve this problem CAEN can be used to build reconfigurable fabrics which, assuming the defects can be found, are inherently defect tolerant. In this paper, we propose a scalable testing methodology for finding defects in reconfigurable devices.