Carnegie Mellon University
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A pattern recognition based method for IC failure analysis

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journal contribution
posted on 1982-01-01, 00:00 authored by Andrzej J. Strojwas, Stephen W. Director
technical report

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Date

1982-01-01

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    Keywords

    Pattern recognition systems.Simulated methods.Integrated circuits.Computer EngineeringElectrical and Electronic Engineering not elsewhere classified

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