posted on 2008-01-01, 00:00authored byRobert Ditizio, Paul Werbaneth, Tegal Corporation, Jian-Gang Zhu
Industrial and academic development laboratories worldwide
are working to perfect the circuit designs, fabrication methods
and integration schemes required for successful commercial
production of Magnetic Random Access Memory (MRAM)
devices, a new kind of nonvolatile memory technology that
some forecast to be a “universal” memory replacement for
DRAM,SRAM and flash.Among the more important issues for
MRAM cell design and fabrication are the basic configuration
of the magnetic memory element (pseudospin-valve or magnetic
tunneling junction, for example), the material set used to
fabricate the magnetic memory element, the shape of the magnetic
memory element and the patterning techniques used to
fabricate the cell. Two important attributes of the MRAM cell
may be unfamiliar to those with experience in other IC fabrication
processes. These are the special considerations that must be
taken when designing the physical shape of the magnetic
memory storage element and the specific fabrication techniques
that need to be applied to pattern the many layers of
alloys (NiFe, for example) and metals (ruthenium, cobalt)
found in the MRAM stack. Ion milling has been the historically-
important method of record for fabricating low-density
MRAM products for applications with limited production volumes.
Now that large IDMs like IBM and Infineon, Motorola,
Philips, STMicroelectronics and NEC are approaching MRAM
processing in earnest, the perceived manufacturing limitations
of ion milling have motivated development teams to consider
other methods, including wet etch, plasma etch and damascene
for patterning MRAM stacks. We review here the theory of
MRAM operation, discuss the interaction between the physical
shape of the MRAM cell and its ability to store binary information,
present the various options for patterning MRAM stacks
as championed by the major IDMs with public MRAM programs,
and summarize some of our own work on plasma etching
MRAM devices.