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Experimental modeling of intergranular exchange coupling for perpendicular thin film media

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journal contribution
posted on 2009-09-01, 00:00 authored by Vincent Sokalski, David E. Laughlin, Jian-Gang Zhu

We present an experimental model system that enables quantitative assessment of intergranular exchange coupling in CoCrPt-oxide perpendicular magnetic recording media. A thin film structure consisting of a high coercivity CoPt unicrystal layer and a lower coercivity CoPt layer separated by a thin oxide interlayer is used to model perpendicularly magnetized grains separated by oxide grain boundaries. Exchange coupling energy between the CoPt layers was obtained for SiOx, TiOx, and CrOx interlayers by measuring field shifts from the lower coercivity layer. Cr segregation in CoCrPt grains to grain boundaries is also modeled experimentally and found to significantly suppress exchange coupling.

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Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article may be found at http://dx.doi.org/10.1063/1.3226638.

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2009-09-01

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