posted on 2005-07-01, 00:00authored byMiroslav N Velev, Randal E. Bryant
We extend the Burch and Dill flushing technique [6] for formal
verification of microprocessors to be applicable to designs where
the functional units and memories have multi-cycle and possibly
arbitrary latency. We also show ways to incorporate exceptions
and branch prediction by exploiting the properties of the logic of
Positive Equality with Uninterpreted Functions [4][5]. We study
the modeling of the above features in different versions of dual-issue
superscalar processors.